Strona: Conference topic / International Seminar of Metrology

Conference topic

Basic problems of metrology, sensors and transducers, signal processing, information and measurement systems

Topics of the conference include, but are not limited to, the following:

  • Metrology and applications
  • Computer-based measurement systems
  • Advances in modern instrumentation
  • Data acquisition systems
  • Real-time measurement systems
  • Measurements for society and welfare
  • Measurement for aerospace
  • Measurement systems and methods for medical, biomedical and healthcare.
  • Micro and nanotechnology in instrumentation and measurement
  • Measurement for electric and magnetic quantities
  • Internet of things, wireless sensors networks
  • Optical measurement system, fiber optic measurements
  • Image and signal processing techniques in measurement
  • Sensors and transducers, microsensors, sensor fusion
  • Virtual measurement systems and soft sensors
  • Non-invasive measurement methods and systems
  • Measurements problems in robotics
  • Mechanical measurements
  • Big data and metrology
  • Measurement for food safety
  • Quality control
  • Calibration and verification
  • Additive manufacturing
  • Solutions for in-line inspection
  • State of the art and challenges of multi-sensor coordinate metrology
  • Uncertainty traceability and reliability of measurements with CMMs
  • Accreditation, certification and general standards
  • Low power measurement devices
  • Measurement in industrial applications, Industry 4.0
  • Measurement systems for oil and drill industry
  • Future metrology tendencies
  • Recent developments in the area of metrological software